International Conferences 게시판읽기 ( In-Ho Jeong, Choong-Mo Nam, Chang-Yup Lee, Jung-Hoon Moon, Jong-Soo Lee, Dong-Wook Kim and Young-Se Kwon, "High Quality RF Passive Integration on Silicon using 35um Thick Oxide Manufacturing Technology", The 52nd Electronic Components and Technology Conference ( 2002 IEEE ECTC ) , San Diego, USA, pp. 1007-1011, May 2002 )

Publication

In-Ho Jeong, Choong-Mo Nam, Chang-Yup Lee, Jung-Hoon Moon, Jong-Soo Lee, Dong-Wook Kim and Young-Se Kwon, "High Quality RF Passive Integration on Silicon using 35um Thick Oxide Manufacturing Technology", The 52nd Electronic Components and Technology Conference (2002 IEEE ECTC), San Diego, USA, pp. 1007-1011, May 2002
In-Ho Jeong, Choong-Mo Nam, Chang-Yup Lee, Jung-Hoon Moon, Jong-Soo Lee, Dong-Wook Kim and Young-Se Kwon, "High Quality RF Passive Integration on Silicon using 35um Thick Oxide Manufacturing Technology", The 52nd Electronic Components and Technology Conference (2002 IEEE ECTC), San Diego, USA, pp. 1007-1011, May 2002
작성자	전파정보통신연구실
조회수	139	등록일	2022.05.31
In-Ho Jeong, Choong-Mo Nam, Chang-Yup Lee, Jung-Hoon Moon, Jong-Soo Lee, Dong-Wook Kim and Young-Se Kwon, "High Quality RF Passive Integration on Silicon using 35um Thick Oxide Manufacturing Technology", The 52nd Electronic Components and Technology Conference (2002 IEEE ECTC), San Diego, USA, pp. 1007-1011, May 2002
첨부	High Quality RF Passive Integration on Silicon using 35um Thick Oxide Manufacturing Technology.pdf (미리보기)